The Lindley Weibull Distribution: properties and applications

被引:33
作者
Cordeiro, Gauss M. [1 ]
Afify, Ahmed Z. [2 ]
Yousof, Haitham M. [2 ]
Cakmakyapan, Selen [3 ]
Ozel, Gamze [4 ]
机构
[1] Univ Fed Pernambuco, Dept Estat, Cidade Univ,Ave Prof Moraes Rego 1235, BR-50740540 Recife, PE, Brazil
[2] Benha Univ, Dept Stat Math & Insurance, Banha 13518, Egypt
[3] Istanbul Medeniyet Univ, Dept Stat, TR-34700 Istanbul, Turkey
[4] Hacettepe Univ, Dept Stat, TR-68000 Ankara, Turkey
来源
ANAIS DA ACADEMIA BRASILEIRA DE CIENCIAS | 2018年 / 90卷 / 03期
关键词
Lindley G-Family; maximum likelihood; moments; order statistics; G FAMILY;
D O I
10.1590/0001-3765201820170635
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
We introduce a new three-parameter lifetime model called the Lindley Weibull distribution, which accommodates unimodal and bathtub, and a broad variety of monotone failure rates. We provide a comprehensive account of some of its mathematical properties including ordinary and incomplete moments, quantile and generating functions and order statistics. The new density function can be expressed as a linear combination of exponentiated Weibull densities. The maximum likelihood method is used to estimate the model parameters. We present simulation results to assess the performance of the maximum likelihood estimation. We prove empirically the importance and flexibility of the new distribution in modeling two data sets.
引用
收藏
页码:2579 / 2598
页数:20
相关论文
共 36 条
[1]  
Afify AZ, 2014, PAK J STAT OPER RES, V10
[2]   The Marshall-Olkin additive Weibull distribution with variable shapes for the hazard rate [J].
Afify, Ahmed Z. ;
Cordeiro, Gauss M. ;
Yousof, Haitham M. ;
Saboor, Abdus ;
Ortega, Edwin M. M. .
HACETTEPE JOURNAL OF MATHEMATICS AND STATISTICS, 2018, 47 (02) :365-381
[3]   A new lifetime model with variable shapes for the hazard rate [J].
Afify, Ahmed Z. ;
Cordeiro, Gauss M. ;
Butt, Nadeem Shafique ;
Ortega, Edwin M. M. ;
Suzuki, Adriano K. .
BRAZILIAN JOURNAL OF PROBABILITY AND STATISTICS, 2017, 31 (03) :516-541
[4]   The Weibull Frechet distribution and its applications [J].
Afify, Ahmed Z. ;
Yousof, Haitham M. ;
Cordeiro, Gauss M. ;
Ortega, Edwin M. M. ;
Nofal, Zohdy M. .
JOURNAL OF APPLIED STATISTICS, 2016, 43 (14) :2608-2626
[5]  
[Anonymous], ARXIV13092961
[6]  
Aryal G.R., 2016, Int J Stat Prob, V6, P126, DOI [10.5539/ijsp.v6n1p126, DOI 10.5539/IJSP.V6N1P126]
[7]  
Aryal GR, 2011, EUR J PURE APPL MATH, V4, P89
[8]  
Asgharzadeh A, 2018, REVSTAT-STAT J, V16, P87
[9]  
CAKMAKYAPAN S, 2017, HACET J MATH STAT, V46, P1
[10]   Goodness-of-fit tests for the generalized Pareto distribution [J].
Choulakian, V ;
Stephens, MA .
TECHNOMETRICS, 2001, 43 (04) :478-484