Jumping mode scanning force microscopy

In this letter, we present a new scanning probe microscopy mode, jumping mode, which allows the simultaneous measurement of the topography and of some other physical property of the sample. Essentially, at each image point first the topography of the sample is measured during a feedback phase of a cycle, and then the tip-sample interaction is evaluated in real time as the tip is moved away and towards the sample. Since the lateral motion is done out of contact the method is free, or nearly free, of shear forces. The general advantages of jumping mode are discussed. Finally, two different applications of this mode are presented. In addition to the topography, the first application measures the adhesion between the tip and the sample, while the second determines the corresponding electrostatic interaction. (C) 1998 American Institute of Physics. [S0003-6951(98)01048-1].