共 50 条
[24]
Antistatic technique for suppressing charging in focused ion beam systems using microprobing and ion-beam-assisted deposition
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS,
2005, 44 (11)
:7907-7909
[26]
Antistatic technique for suppressing charging in focused ion beam systems using microprobing and ion-beam-assisted deposition
[J].
Komoda, H. (hkomoda@nts.ricoh.co.jp),
1600, Japan Society of Applied Physics (44)
[27]
EFFECT OF DEPOSITION PARAMETERS ON THE MICROSTRUCTURE OF ION-BEAM-ASSISTED DEPOSITION TIN FILMS
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1994, 12 (05)
:2723-2727