Self-heating-induced electrical and optical switching in high quality VO2 films controlled with current pulses

被引:2
作者
Gunes, Ozan [1 ]
Koughia, Cyril [1 ]
Zhang, Chunzi [1 ]
Belev, George [2 ]
Wen, Shi-Jie [3 ]
Yang, Qiaoqin [4 ]
Kasap, Safa O. [1 ]
机构
[1] Univ Saskatchewan, Dept Elect & Comp Engn, Saskatoon, SK S7N 5A9, Canada
[2] Saskatchewan Struct Sci Ctr, 110 Sci Pl, Saskatoon, SK S7N 5C9, Canada
[3] Cisco Syst Inc, 170 West Tasman Dr, San Jose, CA 95134 USA
[4] Univ Saskatchewan, Dept Mech Engn, Saskatoon, SK S7N 5A9, Canada
基金
加拿大自然科学与工程研究理事会; 加拿大创新基金会;
关键词
METAL-INSULATOR-TRANSITION; THIN-FILMS; VANADIUM DIOXIDE; PHASE-TRANSITION; FABRICATION; DEPOSITION;
D O I
10.1007/s10854-021-06895-2
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Self-heating (SH)-induced electrical and optical switching in high quality VO2 films grown by magnetron sputtering on a c-cut sapphire substrate has been investigated under various applied constant current pulses (I-D). The effect of SH on the behavior of electrical conductivity (sigma), optical transmittance ((T) over tilde), and film temperature (T) examined by applying a constant current pulse of various magnitudes with a pulse duration of five seconds (Delta t = 5 s) in VO2 films which were pre-heated to and stabilized at 57 degrees C, at the brink of insulator-to-metal transition (IMT). The SH effect that arose from the application of constant I-D pulses led to a significant increase in T and substantial changes in sigma and (T) over tilde. Observations showed that, depending on the magnitude of I-D, the sigma and (T) over tilde demonstrate strikingly different temporal behavior not only during the SH-induced IMT but also after the removal of I-D. The observed phenomena could be explained using a simple model based on percolation theory previously proposed for the present system. The outcome of the model is confirmed by the results of the structural IMT obtained by Raman micromapping.
引用
收藏
页码:24285 / 24295
页数:11
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