Automated crystal orientation mapping (ACOM) with a computer-controlled TEM by interpreting transmission Kikuchi patterns

被引：42

作者：

Schwarzer, RA ^{[1
]}

Sukkau, J ^{[1
]}

机构：

[1] TU, Inst Metallkunde & Metallphys, D-38678 Clausthal Zellerfeld, Germany

来源：

TEXTURE AND ANISOTROPY OF POLYCRYSTALS | 1998年 / 273-2卷

关键词：

BKD; TKD; TEM; pattern recognition; image processing; aggregate function; electron diffraction;

D O I：

10.4028/www.scientific.net/MSF.273-275.215

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A system for acquisition and interpretation of transmission Kikuchi patterns with a camputer-controlled PHILIPS EM 430 TEM is presented. It enables interactive as well as well automated determination of individual grain orientations using digital beam scan for ACOM operation. A high-grade integrating CCD camera is mounted on-axis on the bottom flange of the microscope column. Image resolution is 1,024 by 1,024 pixels, the dynamic range is 14 bit With the present setup more than 3,000 orientations can be measured unattendedly per hour.

引用

页码：215 / 222

页数：8

共 10 条

[1]

[Anonymous], THESIS TU CLAUSTHAL

[2]

[Anonymous], MICROSCOPY ANAL

[3]

[Anonymous], TEXTURES MICROSTRUCT, DOI 10.1155/TSM.21.177

[4] KOHLER ILLUMINATION IN THE TEM - FUNDAMENTALS AND ADVANTAGES [J].

BENNER, G ;

PROBST, W .

JOURNAL OF MICROSCOPY-OXFORD, 1994, 174 :133-142

[5]

SCHUMANN H, 1979, KRISTALLGEOMETRIE

[6] Advances in crystal orientation mapping with the SEM and TEM [J].

Schwarzer, RA .

ULTRAMICROSCOPY, 1997, 67 (1-4) :19-24

[7] Automated crystal lattice orientation mapping using a computer-controlled SEM [J].

Schwarzer, RA .

MICRON, 1997, 28 (03) :249-265

[8]

SCHWARZER RA, 1995, ADV XRAY ANAL, V38, P377

[9]

WEILAND H, 1985, BEDO, V18, P55

[10]

ZAEFFERER S, 1994, Z METALLKD, V85, P585

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