Experimental evaluation of the accuracy of skin dose calculation for a commercial treatment planning system

被引:42
作者
Court, Laurence E. [1 ]
Tishler, Roy B. [1 ]
Allen, Aaron M. [1 ]
Xiang, Hong [1 ]
Makrigiorgos, Mike [1 ]
Chin, Lee [1 ]
机构
[1] Dana Farber Brigham & Womens Canc Ctr, Dept Radiat Oncol, Boston, MA USA
关键词
skin dose; dose calculations; MOSFET;
D O I
10.1120/jacmp.v9i1.2792
中图分类号
R8 [特种医学]; R445 [影像诊断学];
学科分类号
1002 ; 100207 ; 1009 ;
摘要
The present work uses the Eclipse treatment planning system (TPS) to investigate the accuracy of skin dose calculations. Micro-MOSFETs (metal oxide semiconductor field effect transistors) were used to measure skin dose for a range of irradiation conditions (open fields, physical wedges, dynamic wedges, various source-to-surface distances) for 6-MV and 10-MV beams, and the results were compared with the calculated mean dose to a "skin" structure 2 mm thick for semi-cylindrical phantoms (representative of a neck or breast). Agreement between the calculated and measured skin dose values was better than +/- 20% for 95% of all measured points (6-MV and 10-MV X-ray spectra alike). For a fixed geometry, the TPS correctly calculated relative changes in dose, showing that minimization of skin dose in intensity-modulated radiation therapy will be effective in Eclipse.
引用
收藏
页码:29 / 35
页数:7
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