Soft X-ray emission spectroscopy (SXES) has been subject to a revived interest due to the new possibilities offered by the high brightness of the third generation synchrotron radiation sources and the corresponding high performance beamlines and instruments. The inherent ability of SXES to provide site and symmetry selective projections of the valence band electronic structure can be exploited for many problems, and additional elements of selectivity introduced by the well defined energy and polarization properties of the synchrotron beam can be used to obtain further detailed information. An overview is presented of recent advances in soft X-ray fluorescence studies of molecules and solids.
机构:
Tohoku Univ, Inst Multidisciplinary Res Adv Mat, 2-1-1 Katahira, Sendai, Miyagi 9808577, JapanTohoku Univ, Inst Multidisciplinary Res Adv Mat, 2-1-1 Katahira, Sendai, Miyagi 9808577, Japan
Terauchi, M.
Hatano, T.
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Tohoku Univ, Inst Multidisciplinary Res Adv Mat, 2-1-1 Katahira, Sendai, Miyagi 9808577, JapanTohoku Univ, Inst Multidisciplinary Res Adv Mat, 2-1-1 Katahira, Sendai, Miyagi 9808577, Japan
Hatano, T.
Koike, M.
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机构:
Natl Inst Quantum & Radiol Sci & Technol, Quantum Beam Sci Res Directorate, Kizugawa 6190125, JapanTohoku Univ, Inst Multidisciplinary Res Adv Mat, 2-1-1 Katahira, Sendai, Miyagi 9808577, Japan
Koike, M.
Pirozhkov, A. S.
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Natl Inst Quantum & Radiol Sci & Technol, Quantum Beam Sci Res Directorate, Kizugawa 6190125, JapanTohoku Univ, Inst Multidisciplinary Res Adv Mat, 2-1-1 Katahira, Sendai, Miyagi 9808577, Japan
Pirozhkov, A. S.
Sasai, H.
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Shimadzu Co Ltd, Device Dept, Kyoto 6048511, JapanTohoku Univ, Inst Multidisciplinary Res Adv Mat, 2-1-1 Katahira, Sendai, Miyagi 9808577, Japan
Sasai, H.
Nagano, T.
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Shimadzu Co Ltd, Device Dept, Kyoto 6048511, JapanTohoku Univ, Inst Multidisciplinary Res Adv Mat, 2-1-1 Katahira, Sendai, Miyagi 9808577, Japan
Nagano, T.
Takakura, M.
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机构:
JEOL Ltd, SA Business Unit, Akishima, Tokyo 1968558, JapanTohoku Univ, Inst Multidisciplinary Res Adv Mat, 2-1-1 Katahira, Sendai, Miyagi 9808577, Japan
Takakura, M.
Murano, T.
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JEOL Ltd, SA Business Unit, Akishima, Tokyo 1968558, JapanTohoku Univ, Inst Multidisciplinary Res Adv Mat, 2-1-1 Katahira, Sendai, Miyagi 9808577, Japan
Murano, T.
EMAS 2019 WORKSHOP - 16TH EUROPEAN WORKSHOP ON MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS,
2020,
891
机构:
Helmholtz Zentrum Berlin Mat & Energie GmbH, D-14109 Berlin, GermanyHelmholtz Zentrum Berlin Mat & Energie GmbH, D-14109 Berlin, Germany
Pistor, Paul
Koetschau, Immo
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Helmholtz Zentrum Berlin Mat & Energie GmbH, D-14109 Berlin, GermanyHelmholtz Zentrum Berlin Mat & Energie GmbH, D-14109 Berlin, Germany
Koetschau, Immo
Grimm, Alex
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Helmholtz Zentrum Berlin Mat & Energie GmbH, D-14109 Berlin, GermanyHelmholtz Zentrum Berlin Mat & Energie GmbH, D-14109 Berlin, Germany
Grimm, Alex
Jung, Christian
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Helmholtz Zentrum Berlin Mat & Energie GmbH, D-14109 Berlin, GermanyHelmholtz Zentrum Berlin Mat & Energie GmbH, D-14109 Berlin, Germany
Jung, Christian
Lauermann, Iver
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Helmholtz Zentrum Berlin Mat & Energie GmbH, D-14109 Berlin, GermanyHelmholtz Zentrum Berlin Mat & Energie GmbH, D-14109 Berlin, Germany
Lauermann, Iver
Lux-Steiner, Martha Ch.
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Helmholtz Zentrum Berlin Mat & Energie GmbH, D-14109 Berlin, Germany
Free Univ Berlin, Fachbereich Phys, D-14195 Berlin, GermanyHelmholtz Zentrum Berlin Mat & Energie GmbH, D-14109 Berlin, Germany
Lux-Steiner, Martha Ch.
Fischer, Christian-H.
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机构:
Helmholtz Zentrum Berlin Mat & Energie GmbH, D-14109 Berlin, Germany
Free Univ Berlin, Fachbereich Phys, D-14195 Berlin, GermanyHelmholtz Zentrum Berlin Mat & Energie GmbH, D-14109 Berlin, Germany