Corneal thermal damage threshold dependence on the exposure duration for near-infrared laser radiation at 1319 nm

被引:15
|
作者
Wang, Jiarui [1 ]
Jiao, Luguang [1 ]
Chen, Hongxia [2 ]
Yang, Zaifu [1 ]
Hua, Xiangjun [1 ]
机构
[1] Beijing Inst Radiat Med, 27 Taiping Rd, Beijing 100850, Peoples R China
[2] Peoples Liberat Army Gen Hosp, Affiliated Hosp 1, Dept Dermatol, 28 Fuxing Rd, Beijing 100048, Peoples R China
关键词
corneal thermal damage; damage threshold; transitional near-infrared laser; exposure duration; EPITHELIAL INJURY THRESHOLDS; 2.02; MU-M; YAG LASER; IR; LIMITS; PULSES;
D O I
10.1117/1.JBO.21.1.015011
中图分类号
Q5 [生物化学];
学科分类号
071010 ; 081704 ;
摘要
The corneal damage effects induced by 1319-nm transitional near-infrared laser have been investigated for years. However, the damage threshold dependence on exposure duration has not been revealed. The in vivo corneal damage thresholds (ED(50)s) were determined in New Zealand rabbits for 1319-nm laser radiation for exposure durations from 75 ms to 10 s. An additional corneal ED50 was determined at 1338 nm for a 5-ms exposure. The incident corneal irradiance diameter was fixed at 2 mm for all exposure conditions to avoid the influence of spot size on threshold. The ED(50)s given in terms of the corneal radiant exposure for exposure durations of 5 ms, 75 ms, 0.35 s, 2 s, and 10 s were 39.4, 51.5, 87.2, 156.3, and 311.1 J/cm(2), respectively. The 39.4 J/cm(2) was derived from the ED50 for 1338 nm (27.0 J/cm(2)). The ED(50)s for exposure durations of 75 ms to 10 s were correlated by a power law equation, ED50 = 128.9t(0.36) in J/cm(2), where t was the input in the unit of second, with correlation coefficient (R) of 0.997. Enough safe margins existed between the ED(50)s and the maximum permitted exposures from current laser safety standard. (C) 2016 Society of Photo-Optical Instrumentation Engineers (SPIE)
引用
收藏
页数:6
相关论文
共 50 条
  • [21] Near-Infrared Exposure Changes Cellular Responses to Ionizing Radiation
    Heselich, Anja
    Frohns, Florian
    Frohns, Antonia
    Naumann, Steffen C.
    Layer, Paul G.
    PHOTOCHEMISTRY AND PHOTOBIOLOGY, 2012, 88 (01) : 135 - 146
  • [22] Pulse duration dependence of lithographic printing plate imaging by near-infrared lasers
    Hare, DE
    Rhea, ST
    Dlott, DD
    D'Amato, RJ
    Lewis, TE
    JOURNAL OF IMAGING SCIENCE AND TECHNOLOGY, 1998, 42 (02): : 187 - 193
  • [23] Pulse duration dependence of lithographic printing plate imaging by near-infrared lasers
    Univ of Illinois at Urbana Champaign, Urbana, United States
    J Imaging Sci Technol, 2 (187-193):
  • [24] Optical fiber tapers produced by near-infrared laser radiation
    Nespereira, Marta
    Coelho, Joao M. P.
    Monteiro, Fernando
    Abreu, Manuel
    Rebordao, J. M.
    8TH IBEROAMERICAN OPTICS MEETING AND 11TH LATIN AMERICAN MEETING ON OPTICS, LASERS, AND APPLICATIONS, 2013, 8785
  • [25] SiC absorption of near-infrared laser radiation at high temperatures
    Adelmann, B.
    Hellmann, R.
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2016, 122 (07):
  • [26] SiC absorption of near-infrared laser radiation at high temperatures
    B. Adelmann
    R. Hellmann
    Applied Physics A, 2016, 122
  • [27] Risk estimation of skin damage due to ultrashort pulsed, focused near-infrared laser irradiation at 800 nm
    Fischer, Frank
    Volkmer, Beate
    Puschmann, Stefan
    Greinert, Ruediger
    Breitbart, Wolfgang
    Kiefer, Juergen
    Wepf, Roger
    JOURNAL OF BIOMEDICAL OPTICS, 2008, 13 (04)
  • [28] Turbid Media Extinction Coefficient for Near-Infrared Laser Radiation
    Dreischuh, T.
    Gurdev, L.
    Vankov, O.
    Stoyanov, D.
    Avramov, L.
    23RD INTERNATIONAL LASER PHYSICS WORKSHOP (LPHYS'14), 2015, 594
  • [29] Hemoglobin degradation in human erythrocytes with long-duration near-infrared laser exposure in Raman optical tweezers
    Dasgupta, Raktim
    Ahlawat, Sunita
    Verma, Ravi Shanker
    Uppal, Abha
    Gupta, Pradeep Kumar
    JOURNAL OF BIOMEDICAL OPTICS, 2010, 15 (05)
  • [30] Formulation of the criterion of thermoelastic laser damage of transparent dielectrics and the dependence of damage threshold on pulse duration
    Koldunov, MF
    Manenkov, AA
    Pokotilo, IL
    QUANTUM ELECTRONICS, 1997, 27 (10) : 918 - 922