Wavefront sensing based on rotated lateral shearing interferometry

被引：8
作者：
Schwertner, M. [1 ]
Booth, M. J. [1 ]
Wilson, T. [1 ]
机构：
[1] Univ Oxford, Dept Engn Sci, Oxford OX1 3PJ, England
来源：
OPTICS COMMUNICATIONS | 2008年 / 281卷 / 02期
关键词：
D O I：
10.1016/j.optcom.2007.09.025
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We describe a self-referencing method of wavefront sensing based on rotated lateral shearing interferometry which is able to measure the local slope of a wavefront. We describe the principle of operation, suggest a number of practical implementations, and present experimental results. We found the difference between two sequential measurements of a nominally flat wavefront to be better than lambda/250 root mean square. (c) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码：210 / 216
页数：7
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