Atom-Resolved Analysis of an Ionic KBr(001) Crystal Surface Covered with a Thin Water Layer by Frequency Modulation Atomic Force Microscopy

被引：13

作者：

Arai, Toyoko ^{[1
]}

Koshioka, Masashi ^{[1
]}

Abe, Kouhei ^{[1
]}

Tomitori, Masahiko ^{[2
]}

Kokawa, Ryohei ^{[3
]}

Ohta, Masahiro ^{[3
]}

Yamada, Hirofumi ^{[4
]}

Kobayashi, Kei ^{[5
]}

Oyabu, Noriald ^{[4
,6
]}

机构：

[1] Kanazawa Univ, Nat Sci & Technol, Kanazawa, Ishikawa 9201192, Japan

[2] Japan Adv Inst Sci & Technol, Sch Mat Sci, Nomi, Ishikawa 9231292, Japan

[3] Shimadzu Co Ltd, Kyoto 6048511, Japan

[4] Kyoto Univ, JST, Dept Elect Sci & Engn, Kyoto 6158510, Japan

[5] Kyoto Univ, JST, Hakubi Ctr Adv Res, Kyoto 6158510, Japan

[6] Kyoto Univ, JST, SENTAN Program, Kyoto 6158510, Japan

来源：

LANGMUIR | 2015年 / 31卷 / 13期

基金：

日本科学技术振兴机构;

关键词：

ALKALI-HALIDE SURFACES; HYDRATION FORCES; X-RAY; LIQUID; RESOLUTION; POTASSIUM; INTERFACES; SOLVATION; MOLECULES; STRENGTH;

D O I：

10.1021/acs.langmuir.5b00087

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

An ionic KBr(001) crystal surface covered with a thin water layer was observed with a frequency modulation atomic force microscope (FM-AFM) with atomic resolution. By immersing only the tip apex of the AFM cantilever in the thin water layer, the Q-factor of the cantilever in probing the solid-liquid interface can be maintained as high as that of FM-AFM operation in air, leading to improvement of the minimum detection of a differential force determined by the noise. Two types of images with atom-resolved contrast were observed, possibly owing to the different types of ions (K+ or Br-) adsorbed on the tip apex that incorporated into the hydration layers on the tip and on the sample surface. The force-distance characteristics at the solid-water interface were analyzed by taking spatial variation maps of the resonant frequency shift of the AFM cantilever with the high Q-factor. The oscillatory frequency shift-distance curves exhibited atomic site dependence. The roles of hydration and the ions on the tip and on the sample surface in the measurements were discussed.

引用

页码：3876 / 3883

页数：8

共 53 条

[1] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].