Accelerated Degradation Analysis for the Quality of a System Based on the Gamma Process

被引:99
作者
Ling, Man Ho [1 ]
Tsui, Kwok Leung [2 ]
Balakrishnan, Narayanaswamy [3 ]
机构
[1] Hong Kong Inst Educ, Dept Math & Informat Technol, Tai Po, Hong Kong, Peoples R China
[2] City Univ Hong Kong, Dept Syst Engn & Engn Management, Ind Engn, Kowloon, Hong Kong, Peoples R China
[3] McMaster Univ, Dept Math & Stat, Hamilton, ON L8S 4K1, Canada
关键词
Accelerated degradation analysis; asymptotic confidence interval; gamma process; maximum likelihood estimate; remaining useful life; system health; EXPONENTIAL-DISTRIBUTION; LIFE DISTRIBUTIONS; STRESS MODEL; FAILURE; INFERENCE; TESTS;
D O I
10.1109/TR.2014.2337071
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
As most systems these days are highly reliable with long lifetimes, failures of systems become rare; consequently, traditional failure time analysis may not be able to provide a precise assessment of the system reliability. In this regard, a degradation measure, as a percentage of the initial value, is an alternate way of describing the system health. This paper presents accelerated degradation analysis that characterizes the health and quality of systems with monotonic and bounded degradation. The maximum likelihood estimates (MLEs) of the model parameters are derived, based on a gamma process, time-scale transformation, and a power link function for associating the covariates. Then, methods of estimating the reliability, the mean and median lifetime, the conditional reliability, and the remaining useful life of systems under normal use conditions are all described. Moreover, approximate confidence intervals for the parameters of interest are developed based on the observed Fisher information matrix. A model validation metric with exact power is introduced. A Monte Carlo simulation study is carried out for evaluating the performance of the proposed methods. For an illustration of the proposed model, and the methods of inference developed here, a numerical example involving light intensity of light emitting diodes (LED) is analyzed.
引用
收藏
页码:463 / 472
页数:10
相关论文
共 32 条
[1]   Exact inference for a simple step-stress model with competing risks for failure from exponential distribution under Type-II censoring [J].
Balakrishnan, N. ;
Han, Donghoon .
JOURNAL OF STATISTICAL PLANNING AND INFERENCE, 2008, 138 (12) :4172-4186
[2]   Gamma lifetimes and one-shot device testing analysis [J].
Balakrishnan, N. ;
Ling, M. H. .
RELIABILITY ENGINEERING & SYSTEM SAFETY, 2014, 126 :54-64
[3]   Multiple-Stress Model for One-Shot Device Testing Data Under Exponential Distribution [J].
Balakrishnan, Narayanaswamy ;
Ling, Man Ho .
IEEE TRANSACTIONS ON RELIABILITY, 2012, 61 (03) :809-821
[4]   Inference based on Type-II hybrid censored data from a Weibull distribution [J].
Banerjee, Aveek ;
Kundu, Debasis .
IEEE TRANSACTIONS ON RELIABILITY, 2008, 57 (02) :369-378
[5]  
Banjevic D., 2006, IMA Journal of Management Mathematics, V17, P115, DOI 10.1093/imaman/dpi029
[6]  
Banneheka B.M.S.G., 2009, VIYODAYA J SCI, V14, P95
[7]   A NEW FAMILY OF LIFE DISTRIBUTIONS [J].
BIRNBAUM, ZW ;
SAUNDERS, SC .
JOURNAL OF APPLIED PROBABILITY, 1969, 6 (02) :319-&
[8]   Satellite and satellite subsystems reliability: Statistical data analysis and modeling [J].
Castet, Jean-Francois ;
Saleh, Joseph H. .
RELIABILITY ENGINEERING & SYSTEM SAFETY, 2009, 94 (11) :1718-1728
[9]  
Chaluvadi V., 2008, THESIS CLEMSON U CLE
[10]   A frailty model approach for regression analysis of multivariate current status data [J].
Chen, Man-Hua ;
Tong, Xingwei ;
Sun, Jianguo .
STATISTICS IN MEDICINE, 2009, 28 (27) :3424-3436