Standing-wave excited soft x-ray photoemission microscopy: Application to Co microdot magnetic arrays

被引：19

作者：

Gray, Alexander X. ^{[1
,2
]}

Kronast, Florian ^{[3
]}

Papp, Christian ^{[2
,4
]}

Yang, See-Hun ^{[5
]}

Cramm, Stefan ^{[6
]}

Krug, Ingo P. ^{[6
]}

Salmassi, Farhad ^{[7
]}

Gullikson, Eric M. ^{[7
]}

Hilken, Dawn L. ^{[7
]}

Anderson, Erik H. ^{[7
]}

Fischer, Peter ^{[2
]}

Duumlrr, Hermann A. ^{[3
]}

Schneider, Claus M. ^{[6
]}

Fadley, Charles. S. ^{[1
,2
]}

机构：

[1] Univ Calif Davis, Dept Phys, Davis, CA 95616 USA

[2] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA

[3] Helmholtz Zentrum Berlin, D-12489 Berlin, Germany

[4] Univ Erlangen Nurnberg, Lehrstuhl Phys Chem 2, D-91054 Erlangen, Germany

[5] IBM Almaden Res Ctr, San Jose, CA 95120 USA

[6] Res Ctr Julich, Inst Solid State Res IFF 9, D-52425 Julich, Germany

[7] Univ Calif Berkeley, Lawrence Berkeley Lab, Ctr Xray Opt, Berkeley, CA 94720 USA

来源：

APPLIED PHYSICS LETTERS | 2010年 / 97卷 / 06期

关键词：

cobalt; ferromagnetic materials; photoelectron microscopy; X-ray microscopy; DICHROISM; SPECTROSCOPY;

D O I：

10.1063/1.3478215

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We demonstrate the addition of depth resolution to the usual two-dimensional images in photoelectron emission microscopy (PEEM), with application to a square array of circular magnetic Co microdots. The method is based on excitation with soft x-ray standing-waves generated by Bragg reflection from a multilayer mirror substrate. Standing wave is moved vertically through sample simply by varying the photon energy around the Bragg condition. Depth-resolved PEEM images were obtained for all of the observed elements. Photoemission intensities as functions of photon energy were compared to x-ray optical calculations in order to quantitatively derive the depth-resolved film structure of the sample. (C) 2010 American Institute of Physics. [doi:10.1063/1.3478215]

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