Spectroscopic-grade X-ray imaging up to 100-kHz frame rate with controlled-drift detectors

被引：19

作者：

Castoldi, A ^{[1
]}

Guazzoni, C

Rehak, P

Strüder, L

机构：

[1] Politecn Milan, Dipartimento Ingn Ucl CeSNEF, I-20133 Milan, Italy

[2] Ist Nazl Fis Nucl, Sez Milano, I-20133 Milan, Italy

[3] Politecn Milan, Dipartimento Elettron & Informat, I-20133 Milan, Italy

[4] Brookhaven Natl Lab, Instrumentat Div, Upton, NY 11973 USA

[5] Max Planck Inst, Halbleiterlab, D-81739 Munich, Germany

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2001年 / 48卷 / 04期

关键词：

controlled-drift detector; fast readout; X-ray imaging;

D O I：

10.1109/23.958709

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Controlled-drift detectors are fully depleted silicon detectors for X-ray imaging that combine good position resolution with very fast frame readout. The basic feature of the controlled-drift detector is the transport of the charge packets stored in each pixel column to the output electrode by means of a uniform drift field. The drift time of the charge packet identifies the pixel of incidence. Images of an X-ray source obtained with the controlled-drift detector up to 100-kHz frame rate are presented and discussed. The achievable energy resolution as a function of the operating temperature and frame rate is analyzed.

引用

页码：982 / 986

页数：5

共 3 条

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REVIEW OF SCIENTIFIC INSTRUMENTS, 1997, 68 (11) :4271-4274

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