Three-dimensional profiling using the Fourier transform method with a hexagonal grating projection

被引：25

作者：

Iwata, Koichi ^{[1
]}

Kusunoki, Fuminori ^{[2
]}

Moriwaki, Kousuke ^{[1
]}

Fukuda, Hiroki ^{[1
]}

Tomii, Takaharu ^{[3
]}

机构：

[1] Technol Res Inst Osaka Prefecture, Izumi Ku, Osaka 5941157, Japan

[2] DEVELO Solut Inc, Yodogawa Ku, Osaka 5320011, Japan

[3] Visuatool Inc, Minato Ku, Tokyo 1080071, Japan

来源：

APPLIED OPTICS | 2008年 / 47卷 / 12期

关键词：

D O I：

10.1364/AO.47.002103

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present three-dimensional profilometry based on triangulation in which a hexagonal pattern is projected on the object. To obtain an accurate result with a one-shot photographic image, the Fourier transform method and method of excess fraction are adopted. The three grating components of the hexagonal pattern are used. For compactness a new pattern projection scheme is introduced. The experimental results show that the constructed optical system works well for measuring the profile of a mannequin with a height resolution of similar to +/- 1 mm. (C) 2008 Optical Society of America.

引用

页码：2103 / 2108

页数：6

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