The positron distribution in a layered stack sample studied with the use of positron lifetime spectroscopy

被引：5

作者：

Dryzek, Jerzy ^{[1
,2
]}

Horodek, Pawel ^{[1
]}

机构：

[1] Inst Nucl Phys PAN, PL-31342 Krakow, Poland

[2] Opole Univ, Inst Phys, PL-45052 Opole, Poland

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2011年 / 269卷 / 12期

关键词：

Positron implantation profile; Layered samples; Silver; Gold; Aluminum; IMPLANTATION PROFILE; SIMULATION;

D O I：

10.1016/j.nimb.2011.03.025

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Computer simulation using GEANT4 codes indicates an enhancement of the fraction of implanted positrons stopped in the denser regions of a layered sample. However, positron lifetime measurements performed for layers of pure aluminum, silver and gold foils do not reveal this effect, indicating instead that backscattering plays an important role in determining the positron implantation profile in layered and/or heterogeneous samples. (C) 2011 Elsevier B.V. All rights reserved.

引用

页码：1411 / 1416

页数：6

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