Analysis of Signal Reconstruction With Jittered Sampling

被引:5
作者
Masry, Elias [1 ]
机构
[1] Univ Calif San Diego, Dept Elect & Comp Engn, La Jolla, CA 92093 USA
关键词
Central limit theorem; integrated mean-square error; reconstruction of signals from jittered noisy samples; DIGITIZER;
D O I
10.1109/TSP.2010.2078812
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We consider the linear estimation of square integrable signals from jittered noisy samples. We establish an expression for the integrated mean-square error for correlated jitter and noise processes. We also find the optimal weights of the linear filter. For the case of independent identically distributed (i.i.d.) noise and jitter processes, and a suboptimal filter, we derive the asymptotic distribution of the estimate of the signal. Numerical examples are presented.
引用
收藏
页码:27 / 34
页数:8
相关论文
共 10 条
[1]  
[Anonymous], 1980, TABLES INTEGRALS SER
[2]   Characterization of digitizer timebase jitter by means of the Allan variance [J].
Arpaia, P ;
Daponte, P ;
Rapuano, S .
COMPUTER STANDARDS & INTERFACES, 2003, 25 (01) :15-22
[3]   ON THE PROBLEM OF TIME JITTER IN SAMPLING [J].
BALAKRISHNAN, AV .
IRE TRANSACTIONS ON INFORMATION THEORY, 1962, 8 (03) :226-236
[4]   SAMPLING WITH RANDOM JITTER [J].
BROWN, WM .
JOURNAL OF THE SOCIETY FOR INDUSTRIAL AND APPLIED MATHEMATICS, 1963, 11 (02) :460-473
[5]  
CHOU YS, 1988, PROBABILITY THEORY I
[6]   ERROR BOUNDS FOR JITTERED SAMPLING [J].
LIU, B ;
STANLEY, TP .
IEEE TRANSACTIONS ON AUTOMATIC CONTROL, 1965, AC10 (04) :449-&
[7]  
LOEVE M, 1963, PROBABILITY THEORY
[8]   Field Estimation From Randomly Located Binary Noisy Sensors [J].
Masry, Elias ;
Ishwar, Prakash .
IEEE TRANSACTIONS ON INFORMATION THEORY, 2009, 55 (11) :5197-5210
[9]   Signal Reconstruction Errors in Jittered Sampling [J].
Nordio, Alessandro ;
Chiasserini, Carla-Fabiana ;
Viterbo, Emanuele .
IEEE TRANSACTIONS ON SIGNAL PROCESSING, 2009, 57 (12) :4711-4718
[10]   ACCURATE SPECTRAL ESTIMATION BASED ON MEASUREMENTS WITH A DISTORTED-TIMEBASE DIGITIZER [J].
VERSPECHT, J .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1994, 43 (02) :210-215