Advances in quantum metrology

被引：0
作者：
Giovannetti, Vittorio [1 ,2 ]
Lloyd, Seth [3 ,4 ]
Maccone, Lorenzo [5 ]
机构：
[1] Scuola Normale Super Pisa, NEST, I-56126 Pisa, Italy
[2] CNR, Ist Nanosci, I-56126 Pisa, Italy
[3] MIT, Elect Res Lab, Cambridge, MA 02139 USA
[4] MIT, Dept Mech Engn, Cambridge, MA 02139 USA
[5] Univ Pavia, Dip Fis A Volta, Ist Nazl Fis Nucl, Sez Pavia, I-27100 Pavia, Italy
来源：
NATURE PHOTONICS | 2011年 / 5卷 / 04期
基金：
美国国家科学基金会;
关键词：
PARAMETER-ESTIMATION; PHASE MEASUREMENTS; HEISENBERG LIMIT; NOON STATES; ENTANGLEMENT; INTERFEROMETRY; SPECTROSCOPY; GEOMETRY; CHANNELS; PHOTONS;
D O I：
10.1038/NPHOTON.2011.35
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The statistical error in any estimation can be reduced by repeating the measurement and averaging the results. The central limit theorem implies that the reduction is proportional to the square root of the number of repetitions. Quantum metrology is the use of quantum techniques such as entanglement to yield higher statistical precision than purely classical approaches. In this Review, we analyse some of the most promising recent developments of this research field and point out some of the new experiments. We then look at one of the major new trends of the field: analyses of the effects of noise and experimental imperfections.
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收藏
页码：222 / 229
页数：8
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