Toward Robust Subthreshold Circuit Design - Variability and Soft Error Perspective

被引：0
|
作者：
Hashimoto, Masanori [1 ,2 ]
机构：
[1] Osaka Univ, Dept Informat Syst Engn, Suita, Osaka 565, Japan
[2] JST, CREST, Tokyo, Japan
来源：
2014 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) | 2014年
关键词：
D O I：
暂无
中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
Subthreshold circuits are drawing attention for ultra-low power application. However, subthreshold circuits have inherent problems that their performance is extremely sensitive to manufacturing and environmental variability and they are susceptible to soft errors. This paper discusses robust subthreshold circuit design from variability and soft error perspective.
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页数：2
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