Biaxial versus uniaxial strain tuning of single-layer MoS2

被引:51
作者
Carrascoso, Felix [1 ]
Frisenda, Riccardo [1 ]
Castellanos-Gomez, Andres [1 ]
机构
[1] Inst Ciencia Mat Madrid ICMM CSIC, Mat Sci Factory, Madrid 28049, Spain
基金
欧盟地平线“2020”; 欧洲研究理事会;
关键词
2D materials; MoS2; Strain engineering; biaxial strain; uniaxial strain; reflectance spectra; ELECTRONIC-PROPERTIES; MONOLAYER MOS2; PHOTOLUMINESCENCE;
D O I
10.1016/j.nanoms.2021.03.001
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Strain engineering has arisen as a powerful technique to tune the electronic and optical properties of two-dimensional semiconductors like molybdenum disulfide (MoS2). Although several theoretical works predicted that biaxial strain would be more effective than uniaxial strain to tune the band structure of MoS2, a direct experimental verification is still missing in the literature. Here we implemented a simple experimental setup that allows to apply biaxial strain through the bending of a cruciform polymer substrate. We used the setup to study the effect of biaxial strain on the differential reflectance spectra of 12 single-layer MoS2 flakes finding a redshift of the excitonic features at a rate between -40 meV/% and -110 meV/% of biaxial tension. We also directly compare the effect of biaxial and uniaxial strain on the same single-layer MoS2 finding that the biaxial strain gauge factor is 2.3 times larger than the uniaxial strain one.
引用
收藏
页码:44 / 51
页数:8
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