Anisotropic resistivity in epitaxial Bi2Sr2-xLaxCuO6 films grown on tilted (001) SrTiO3 substrate

被引：2
作者：
Qin, YL
Zhang, YZ
Li, L
机构：
[1] Chinese Acad Sci, Inst Phys, Natl Lab Superconduct, Beijing 100080, Peoples R China
[2] Chinese Acad Sci, Ctr Condensed Matter Phys, Beijing 100080, Peoples R China
来源：
SUPERCONDUCTOR SCIENCE & TECHNOLOGY | 1998年 / 11卷 / 11期
关键词：
D O I：
10.1088/0953-2048/11/11/012
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Epitaxial Bi2Sr2-xLaxCuO6+delta thin films were successfully deposited on tilted (001) SiTiO3 substrates by in situ RF-magnetron sputtering. Good alignment of the film b-axis with the incommensurate modulation along [110] of SrTiO3 and the film c-axis tilted 6 degrees toward [111] from the surface normal were confirmed by XRD, AFM and XTEM. From the in-plane resistivity measurements, the in-plane and out-of-plane resistivities rho(a) and rho(c) were deduced.
引用
收藏
页码：1266 / 1268
页数：3
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