Evaluation of temperature and humidity on PV module degradation- in field degradation analysis of crystalline silicon module

被引：0
作者：
Li, Hailing [1 ,2 ,3 ]
Lv, Fang [1 ,2 ]
Diao, Hongwei [1 ,2 ]
Chen, Xu [1 ,2 ]
Wang, Wenjing [1 ,2 ,3 ]
机构：
[1] Chinese Acad Sci, Key Lab Solar Thermal Energy & Photovolta Syst, Beijing 100190, Peoples R China
[2] Chinese Acad Sci, Inst Elect Engn, Beijing, Peoples R China
[3] Univ Chinese Acad Sci UCAS, Beijing 100190, Peoples R China
来源：
2019 IEEE 46TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC) | 2019年
关键词：
Photovoltaic systems; module; silicon; degradation;
D O I：
10.1109/pvsc40753.2019.8981241
中图分类号：
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号：
0807 ; 0820 ;
摘要：
PV modules operated in humid and hot climate area in different sites with different operating years were investigated. The average degradation rate is 1.18%/y, higher than guarantee of 20% for 25 years (0.8%/y). By investigating modules from 3 plants operating for 3 years, 6 years and 15 years, the influence of operating year on degradation are studied. As reported before, corrosion of metallic materials is considered to be one of the main degradation models. We find linear relationship between FF and P. degradation, especially at the case with long operating year.
引用
收藏
页码：1986 / 1990
页数：5
相关论文
共 50 条
  • [21] In-Field Energy Performance of Solar PV Module Made of UMG Silicon
    Roberto Guerra, Moises
    de la Parra Laita, Inigo
    Garcia Solano, Miguel
    Pascual, Julio
    IEEE JOURNAL OF PHOTOVOLTAICS, 2022, 12 (05): : 1109 - 1115
  • [22] Degradation Analysis of High Concentration Photovoltaic Module
    Liang, Y. P.
    Lin, K. H.
    Shih, Z. H.
    Hong, H. F.
    Shin, H. Y.
    Kuo, C. T.
    6TH INTERNATIONAL CONFERENCE ON CONCENTRATING PHOTOVOLTAIC SYSTEMS (CPV-6), 2010, 1277 : 256 - +
  • [23] Calculation of Degradation Rates of Poly Crystalline Si and CIGS PV Module using Outdoor Linear Interpolation Method
    Izumi, Yoshiro
    Ueda, Yuzuru
    2018 7TH INTERNATIONAL CONFERENCE ON RENEWABLE ENERGY RESEARCH AND APPLICATIONS (ICRERA), 2018, : 365 - 370
  • [24] Correspondence: Bill of Materials Variation and Module Degradation in Utility-Scale PV Systems
    Deceglie, Michael G.
    Gaulding, E. Ashley
    Mangum, John S.
    Silverman, Timothy J.
    Johnston, Steve W.
    Rand, James A.
    Reed, Mason J.
    Flottemesch, Robert
    Repins, Ingrid L.
    IEEE JOURNAL OF PHOTOVOLTAICS, 2022, 12 (06): : 1349 - 1353
  • [25] Testing and Analysis for Lifetime Prediction of Crystalline Silicon PV Modules Undergoing Degradation by System Voltage Stress
    Hacke, Peter
    Smith, Ryan
    Terwilliger, Kent
    Glick, Stephen
    Jordan, Dirk
    Johnston, Steve
    Kempe, Michael
    Kurtz, Sarah
    2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2, 2013,
  • [26] Testing and Analysis for Lifetime Prediction of Crystalline Silicon PV Modules Undergoing Degradation by System Voltage Stress
    Hacke, Peter
    Smith, Ryan
    Terwilliger, Kent
    Glick, Stephen
    Jordan, Dirk
    Johnston, Steve
    Kempe, Michael
    Kurtz, Sarah
    2012 38TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), 2012, : 1750 - 1755
  • [27] Testing and Analysis for Lifetime Prediction of Crystalline Silicon PV Modules Undergoing Degradation by System Voltage Stress
    Hacke, Peter
    Smith, Ryan
    Terwilliger, Kent
    Glick, Stephen
    Jordan, Dirk
    Johnston, Steve
    Kempe, Michael
    Kurtz, Sarah
    IEEE JOURNAL OF PHOTOVOLTAICS, 2013, 3 (01): : 246 - 253
  • [28] Photovoltaic module reliability model based on field degradation studies
    Vazquez, Manuel
    Rey-Stolle, Ignacio
    PROGRESS IN PHOTOVOLTAICS, 2008, 16 (05): : 419 - 433
  • [29] Determination of PV Module Power Output Degradation after Long Term Operation
    Aziz, Tariq
    Ketjoy, Nipon
    Sirisamphanwong, Chatchai
    PROCEEDINGS OF THE 2014 INTERNATIONAL CONFERENCE & UTILITY EXHIBITION ON GREEN ENERGY FOR SUSTAINABLE DEVELOPMENT (ICUE), 2014,
  • [30] Reliability evaluation of a photovoltaic module using accelerated degradation model
    Laronde, Remi
    Charki, Abderafi
    Bigaud, David
    Excoffier, Philippe
    RELIABILITY OF PHOTOVOLTAIC CELLS, MODULES, COMPONENTS, AND SYSTEMS IV, 2011, 8112
12345