Protective properties of YSZ/Ti film deposited on CoSb3 thermoelectric material

被引：5
作者：
Zhao, Degang [1 ]
Bai, Shengqiang [2 ]
Ma, Qian [1 ]
Zuo, Min [1 ]
Teng, Xinying [1 ]
机构：
[1] Univ Jinan, Sch Mat Sci & Engn, Jinan 250022, Peoples R China
[2] Chinese Acad Sci, Shanghai Inst Ceram, State Key Lab High Performance Ceram & Superfine, Shanghai 200050, Peoples R China
来源：
CORROSION SCIENCE | 2015年 / 98卷
基金：
中国国家自然科学基金;
关键词：
Sputtered films; SEM; Oxide coating; RELIABILITY EVALUATION; TEMPERATURE; OXIDATION; MICROSTRUCTURE; BEHAVIOR; GROWTH; SKUTTERUDITES; RESISTANCE; KINETICS;
D O I：
10.1016/j.corsci.2015.05.011
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The YSZ (yttria-stabilized zirconia)/Ti film was deposited on CoSb3 substrate by magnetron sputtering to suppress the sublimation of antimony in CoSb3 during thermal aging test. Both YSZ and Ti film were columnar crystal. The YSZ film typically grew on Ti film in the island mode. No cracks, porosity or other defects were observed on YSZ film. The weight loss per unit area of CoSb3 samples coated with YSZ/Ti film was much lower than that of uncoated CoSb3 sample after accelerated thermal aging test. The results indicated that the sublimation of antimony in CoSb3 was effectively suppressed by YSZ/Ti film. (C) 2015 Elsevier Ltd. All rights reserved.
引用
收藏
页码：163 / 169
页数：7
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