Resolving Bulk and Grain Boundary Transport Properties of TiO2 Thin Films Enabled by Laser-Induced Anisotropic Morphology

被引：6

作者：

Ankonina, Guy ^{[1
]}

Chung, Ui-Jin ^{[2
]}

Chitu, Adrian M. ^{[2
]}

Komem, Yigal ^{[1
,2
]}

Rothschild, Avner ^{[1
]}

机构：

[1] Technion Israel Inst Technol, Dept Mat Engn, IL-32000 Haifa, Israel

[2] Columbia Univ, Dept Appl Phys & Appl Math, New York, NY 10017 USA

来源：

ADVANCED MATERIALS | 2011年 / 23卷 / 29期

关键词：

ELECTRICAL-PROPERTIES; GAS SENSORS; POLYCRYSTALLINE; CONDUCTION;

D O I：

10.1002/adma.201100917

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Precise deconvolution of grain and grain boundary contributions to the overall impedance of TiO2 thin films is achieved by impedance spectroscopy measurements of textured films with elongated grains obtained by laser-induced melting and sequential lateral solidification. The ability to engineer the grain morphology of electroceramic films provides opportunities for new designs of ferroelectric memories, piezoelectric microsensors and microactuators, optical waveguides, and other devices.

引用

页码：3266 / +

页数：7

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