On the determination of local residual stress gradients by the slit milling method

被引:25
作者
Mansilla, C. [1 ]
Martinez-Martinez, D. [1 ]
Ocelik, V. [1 ]
De Hosson, J. Th M. [1 ]
机构
[1] Univ Groningen, Mat innovat Inst M2i, Dept Appl Phys, NL-9747 AG Groningen, Netherlands
关键词
THIN-FILMS; PART; COATINGS;
D O I
10.1007/s10853-015-8927-y
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper concentrates on an extension of a rather new methodology to determine local residual gradients at an enhanced lateral resolution using the so-called slit milling technique. The method is based on stress relaxation by making a slit using a focused ion beam and the displacements are measured through digital image correlation so as to calculate the residual stress. Our novel approach consists of a multiple fitting procedure along the length of the slit instead of the commonly applied averaging method. The applicability of our approach is demonstrated when stress gradients exist. In accordance to the Saint-Venant principle in linear elasticity, longer slits are better than shorter slits because of end effects. The proof-of-principle is supported by measurements on steel under controlled bending and by finite element modeling.
引用
收藏
页码:3646 / 3655
页数:10
相关论文
共 34 条
[1]  
[Anonymous], 2009, IMAGE CORRELATION SH, DOI DOI 10.1007/978-0-387-78747-3
[2]  
Cheng W, 2007, MECH ENG SER, P1
[3]   Eigenstrain-based model for prediction of laser peening residual stresses in arbitrary three-dimensional bodies. Part 1: model description [J].
DeWald, A. T. ;
Hill, M. R. .
JOURNAL OF STRAIN ANALYSIS FOR ENGINEERING DESIGN, 2009, 44 (01) :1-11
[4]  
GOM mbH, 2004, AR V 5 3 0 US MAN
[5]   3-DIMENSIONAL DISPLACEMENT MEASUREMENTS USING DIGITAL IMAGE CORRELATION AND PHOTOGRAMMIC ANALYSIS [J].
KAHNJETTER, ZL ;
CHU, TC .
EXPERIMENTAL MECHANICS, 1990, 30 (01) :10-16
[6]   Effect of geometry and materials on residual stress measurement in thin films by using the focused ion beam [J].
Kang, KJ ;
Darzens, S ;
Choi, GS .
JOURNAL OF ENGINEERING MATERIALS AND TECHNOLOGY-TRANSACTIONS OF THE ASME, 2004, 126 (04) :457-464
[7]   A method for in situ measurement of the residual stress in thin films by using the focused ion beam [J].
Kang, KJ ;
Yao, N ;
He, MY ;
Evans, AG .
THIN SOLID FILMS, 2003, 443 (1-2) :71-77
[8]   Residual stress evaluation at the micrometer scale: Analysis of thin coatings by FIB milling and digital image correlation [J].
Korsunsky, Alexander M. ;
Sebastiani, Marco ;
Bemporad, Edoardo .
SURFACE & COATINGS TECHNOLOGY, 2010, 205 (07) :2393-2403
[9]   Focused ion beam ring drilling for residual stress evaluation [J].
Korsunsky, Alexander M. ;
Sebastiani, Marco ;
Bemporad, Edoardo .
MATERIALS LETTERS, 2009, 63 (22) :1961-1963
[10]   A simple method for residual stress measurements in thin films by means of focused ion beam milling and digital image correlation [J].
Krottenthaler, M. ;
Schmid, C. ;
Schaufler, J. ;
Durst, K. ;
Goeken, M. .
SURFACE & COATINGS TECHNOLOGY, 2013, 215 :247-252