Shearing interferometer for quantifying the coherence of hard x-ray beams

被引：119

作者：

Pfeiffer, F ^{[1
]}

Bunk, O

Schulze-Briese, C

Diaz, A

Weitkamp, T

David, C

van der Veen, JF

Vartanyants, I

Robinson, IK

机构：

[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

[2] DESY, HASYLAB, D-22607 Hamburg, Germany

[3] Univ Illinois, Dept Phys, Urbana, IL 61801 USA

来源：

PHYSICAL REVIEW LETTERS | 2005年 / 94卷 / 16期

关键词：

D O I：

10.1103/PhysRevLett.94.164801

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We report a quantitative measurement of the full transverse coherence function of the 14.4 keV x-ray radiation produced by an undulator at the Swiss Light Source. An x-ray grating interferometer consisting of a beam splitter phase grating and an analyzer amplitude grating has been used to measure the degree of coherence as a function of the beam separation out to 30 mu m. Importantly, the technique provides a model-free and spatially resolved measurement of the complex coherence function and is not restricted to high resolution detectors and small fields of view. The spatial characterization of the wave front has important applications in discovering localized defects in beam line optics.

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