Phase Transformation-Induced Quantum Dot States on the Bi/Si(111) Surface

Nanopatterns at near atomic dimensions with controllable quantum dot states (QDSs) are promising candidates for the continued downscaling of electronic devices. Herein, we report a phase transition-induced QD system achieved on the root 3 x root 3-Bi/Si(111) surface reconstruction, which points the way to a novel strategy on QDS implementation. Combining scanning tunneling microscopy, scanning tunneling spectroscopy, and density functional theory (DFT) calculations, the structure, energy dispersion, and size effect on band gap of the QDs are measured and verified. As-created QDs can be manipulated with a dot size down to 2 nm via Bi phase transformation, which, in turn, is triggered by thermal annealing at 700 K. The transition mechanism is also supported by our DFT calculations, and an empirical analytical model is developed to predict the transformation kinetics.