A Low Cost Impedance Measurement Method for Integrated Circuits

被引:0
|
作者
Couraud, Benoit [1 ]
Vauche, Remy [2 ,3 ]
Deleruyelle, Thibaut [1 ]
Kussener, Edith [1 ]
机构
[1] ISEN Toulon, Campus St Jerome, F-13397 Marseille, France
[2] Aix Marseille Univ, IM2NP, F-13397 Marseille, France
[3] CNRS, UMR 7334 IM2NP, F-13397 Marseille, France
来源
2015 IEEE 16TH INTERNATIONAL CONFERENCE ON COMMUNICATION TECHNOLOGY (ICCT) | 2015年
关键词
NFC; Impedance measurement; Proximity cards; S-parameters;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Impedance matching of a Radio Frequency (RF) device antenna with its integrated circuit chip is necessary to improve efficiency and RF communication quality. This matching can only be done if one knows the chip components impedances. This paper presents a new RFmeasurement method to determine electrical characteristics like s-parameters or impedance of smart cards integrated circuits or antennas, using common measurement devices as a computer, an oscilloscope or any voltage acquisition device, and a directional coupler. Achieved results are compared with vector network analyzer (VNA) measurements and the method is applied to real contactless integrated circuit proximity cards components.
引用
收藏
页码:13 / 16
页数:4
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