Analysis of some coins by energy dispersive X-ray fluorescence (EDXRF) and high energy particle induced X-ray emission (PIXE) techniques

被引：19

作者：

Santra, S

Mitra, D

Sarkar, M

Bhattacharya, D

Denker, A

Opitz-Coutureau, J

Rauschenberg, J

机构：

[1] Saha Inst Nucl Phys, Nucl & Atom Phys Div, Kolkata 700064, W Bengal, India

[2] HMI, Berlin, Germany

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2005年 / 229卷 / 3-4期

关键词：

EDXRF; high energy PIXE; coin analysis;

D O I：

10.1016/j.nimb.2004.12.125

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

15 Indian coins have been analysed with energy dispersive X-ray fluorescence (EDXRF) and high energy particle induced X-ray emission (PIXE) techniques. A comparison of the analysis shows that the results obtained by these two techniques are in good agreement with each other. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：465 / 470

页数：6

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