Ni-doped α-Fe2O3 as electron transporting material for planar heterojunction perovskite solar cells with improved efficiency, reduced hysteresis and ultraviolet stability

被引:70
作者
Guo, Ying [1 ]
Liu, Tao [1 ]
Wang, Ning [1 ,2 ]
Luo, Qiang [1 ]
Lin, Hong [3 ]
Li, Jianbao [2 ]
Jiang, Qinglong [4 ]
Wu, Lili [5 ]
Guo, Zhanhu [5 ]
机构
[1] Univ Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Peoples R China
[2] Hainan Univ, State Key Lab Marine Resource Utilizat South Chin, Haikou 570228, Peoples R China
[3] Tsinghua Univ, Sch Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
[4] Argonne Natl Lab, Div Mat Sci, Lemont, IL 60439 USA
[5] Univ Tennessee, Dept Chem & Biomol Engn, ICL, Knoxville, TN 37966 USA
关键词
Ni-doped alpha-Fe2O3; Electron transporting layer; Hysteresis; Stabilized power output; UV-light and ambient stability; Perovskite solar cells; I-V HYSTERESIS; LOW-TEMPERATURE; NANOCRYSTALLINE TIO2; HALIDE PEROVSKITES; THIN-FILMS; PERFORMANCE; LAYER; AREA; PHOTOANODES; TRIHALIDE;
D O I
10.1016/j.nanoen.2017.05.026
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We report on high-efficiency planar heterojunction perovskite solar cells (PSCs) employing Ni-doped alpha-Fe2O3 as electron-transporting layer (ETL). The suitable addition of nickel (Ni) dopant could enhance the electron conductivity as well as induce downward shift of the conduction band minimum for alpha-Fe2O3, which facilitate electrons injection and transfer from the conduction band of the perovskite. As a consequence, a substantial reduction in the charge accumulation at the perovskite/ETL interface makes the device much less sensitive to scanning rate and direction, i.e., lower hysteresis. With a reverse scan for the optimized PSC under standard AM-1.5 sunlight illumination, it generates a competitive power conversion efficiency (PCE) of 14.2% with a large short circuit current (J(sc)) of 22.35 mA/cm(2), an open circuit photovoltage (V-oc) of 0.92 V and a fill factor (FF) of 69.1%. Due to the small J-V hysteresis behavior, a higher stabilized PCE up to 11.6% near the maximum power point can be reached for the device fabricated with 4 mol% Ni-doped alpha-Fe2O3 ETL compared with the undoped alpha-Fe2O3 based cell (9.2%). Furthermore, a good stability of devices with exposure to ambient air and high levels of ultraviolet (UV)-light can be achieved. Overall, our results demonstrate that the simple solution-processed Ni-doped alpha-Fe2O3 can be a good candidate of the n-type collection layer for commercialization of PSCs.
引用
收藏
页码:193 / 200
页数:8
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