Quantum Efficiency Study and Reflectivity Enhancement of Au/Bi Absorbers

被引：8

作者：

Hummatov, R. ^{[1
,2
]}

Adams, J. S. ^{[1
,2
]}

Bandler, S. R. ^{[1
]}

Barlis, A. ^{[1
]}

Beaumont, S. ^{[1
,2
]}

Chang, M. P. ^{[1
,3
]}

Chervenak, J. A. ^{[1
]}

Datesman, A. M. ^{[1
,3
]}

Eckart, M. E. ^{[4
]}

Finkbeiner, F. M. ^{[1
,5
]}

Ha, J. Y. ^{[1
,6
]}

Kelley, R. L. ^{[1
]}

Kilbourne, C. A. ^{[1
]}

Miniussi, A. R. ^{[1
,2
]}

Porter, F. S. ^{[1
]}

Sadleir, J. E. ^{[1
]}

Sakai, K. ^{[1
,2
]}

Smith, S. J. ^{[1
,2
]}

Wakeham, N. ^{[1
,2
]}

Wassell, E. J. ^{[1
,3
]}

Wollack, E. J. ^{[1
]}

机构：

[1] NASA, Goddard Space Flight Ctr, Greenbelt, MD 20771 USA

[2] Univ Maryland, CRESSST II, Baltimore, MD 21250 USA

[3] Sci Syst & Applicat Inc, 10210 Greenbelt Rd, Lanham, MD 20706 USA

[4] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA

[5] Sigma Space Corp, 4600 Forbes Blvd, Lanham, MD 20706 USA

[6] SB Microsyst, 806 Cromwell Pk Dr, Glen Burnie, MD 21061 USA

来源：

JOURNAL OF LOW TEMPERATURE PHYSICS | 2020年 / 199卷 / 1-2期

关键词：

Transition edge sensor; Microcalorimeter; Au; Bi; Quantum efficiency; Reflectance;

D O I：

10.1007/s10909-020-02424-3

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

X-ray absorbers of the X-ray Integral Field Unit (X-IFU) microcalorimeters are required to provide high quantum efficiency (QE) for incident X-rays and high reflectivity to longer wavelength radiation. The thickness of the electroplated Au and Bi layers of the absorber is tuned to provide the desired pixel heat capacity and the QE. To calculate the QE precisely, in addition to filling factor, we have included the effects of surface roughness, edge profile of the absorbers and the effects of the different angles of incidence of the incoming X-rays from the X-IFU optic. Based on this analysis, it is found that thickness of the Bi layer needs to be adjusted by 4.3% to achieve the X-IFU QE requirements. To enhance the absorber's rejection of low-energy radiation, a second thin layer of Au is sputter-deposited on top of the Bi layer. Optical measurements in the wavelength range 0.3-20 mu m show a significant increase in reflectivity compared to a bare Bi layer.

引用

页码：393 / 400

页数：8

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