Fabrication and characterization of ferroelectric Ba0.6Sr0.4TiO3 thin film for infrared detection application

被引：0

作者：

Saif, Ala'eddin A. ^{[1
]}

Poopalan, P. ^{[1
]}

机构：

[1] Univ Malaysia Perlis, Sch Microelect Engn, Kuala Perlis 02000, Perlis, Malaysia

来源：

OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS | 2010年 / 4卷 / 12期

关键词：

BST; Ferroelectric; FTIR; IR detection; DIELECTRIC-PROPERTIES;

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Perovskite phase Ba0.6Sr0.4TiO3 thin film has been prepared using sol-gel technique. IR transmittance spectrum shows that the bands are located in the range of 1100 and 400 cm(-1). These bands could be due to Ba-O-Ti, Sr-O-Ti or TiO3 bonds. The response of Ba0.6Sr0.4TiO3 film to IR radiation has been investigated using capacitance-voltage (C-V) and current density-voltage (J-V) characteristics, the results show the capacitance slightly increase as the frequency of the IR radiation decreases, however, no appreciable change on the leakage current curve is observed.

引用

页码：2008 / 2010

页数：3

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