Prism-Coupled Scanning Tunneling Microscope Light Emission Spectroscopy of Au Film Covered with Self-Assembled Alkanethiol Monolayer

被引:8
作者
Ahamed, Jamal Uddin [1 ]
Sanbongi, Tomonori [1 ]
Katano, Satoshi [1 ]
Uehara, Yoichi [1 ]
机构
[1] Tohoku Univ, Elect Commun Res Inst, Aoba Ku, Sendai, Miyagi 9808577, Japan
关键词
PHOTON-EMISSION; OPTICAL-CONSTANTS; SURFACE-PLASMONS; WORK FUNCTION; RESOLUTION; METALS;
D O I
10.1143/JJAP.49.08LB09
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have investigated scanning tunneling microscope (STM) light emission from bare and alkanethiol self-assembled monolayer (SAM)-covered Au films in the Kretschmann geometry. The films were deposited on the flat bottom of a hemispherical prism, and the STM light emissions from the tip-sample gap into the vaccum (tip side emission) and into the prism (prism-side emission) were measured. The prism-side emission was much stronger than the tip side emission for the bare Au film. Theoretical analysis revealed that this enhancement of emission intensity is caused by the fact that surface plasmon polaritons(SPPs) localized at the Au surface become radiative on the prism side. This geometry was applied to the investigations of STM light remission from the Au film covered with an alkanethiol SAM. The prism-side emission was successfully detected by virtue of the enhancement of STM light emission. (C) 2010 The Japan Society of Applied Physics
引用
收藏
页数:3
相关论文
共 19 条
[1]   Light emission induced by a scanning tunnel microscope from a doubly layered substrate [J].
Amemiya, K .
PHYSICAL REVIEW B, 2003, 67 (07)
[2]   Multiple-fiber collection system for scanning tunneling microscope light emission spectroscopy [J].
Arafune, R ;
Sakamoto, K ;
Meguro, K ;
Satoh, M ;
Arai, A ;
Ushioda, S .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (9A) :5450-5453
[3]   ATOMIC-RESOLUTION IN PHOTON-EMISSION INDUCED BY A SCANNING TUNNELING MICROSCOPE [J].
BERNDT, R ;
GAISCH, R ;
SCHNEIDER, WD ;
GIMZEWSKI, JK ;
REIHL, B ;
SCHLITTLER, RR ;
TSCHUDY, M .
PHYSICAL REVIEW LETTERS, 1995, 74 (01) :102-105
[4]   PHOTON-EMISSION SCANNING TUNNELING MICROSCOPE [J].
BERNDT, R ;
SCHLITTLER, RR ;
GIMZEWSKI, JK .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02) :573-577
[5]   PHOTON-EMISSION AT MOLECULAR RESOLUTION INDUCED BY A SCANNING TUNNELING MICROSCOPE [J].
BERNDT, R ;
GAISCH, R ;
GIMZEWSKI, JK ;
REIHL, B ;
SCHLITTLER, RR ;
SCHNEIDER, WD ;
TSCHUDY, M .
SCIENCE, 1993, 262 (5138) :1425-1427
[6]   PHOTON-EMISSION EXPERIMENTS WITH THE SCANNING TUNNELLING MICROSCOPE [J].
COOMBS, JH ;
GIMZEWSKI, JK ;
REIHL, B ;
SASS, JK ;
SCHLITTLER, RR .
JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 :325-336
[7]   WORK FUNCTION OF POLYCRYSTALLINE TUNGSTEN FOIL [J].
HOPKINS, BJ ;
RIVIERE, JC .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1963, 81 (521) :590-&
[8]   OPTICAL CONSTANTS OF NOBLE METALS [J].
JOHNSON, PB ;
CHRISTY, RW .
PHYSICAL REVIEW B, 1972, 6 (12) :4370-4379
[9]   DETERMINATION OF OPTICAL CONSTANTS OF METALS BY EXCITATION OF SURFACE PLASMONS [J].
KRETSCHM.E .
ZEITSCHRIFT FUR PHYSIK, 1971, 241 (04) :313-&
[10]  
Lynch D W, 1985, HDB OPTICAL CONSTANT, P357