Coulomb interactions in high-coherence femtosecond electron pulses from tip emitters

被引:35
作者
Bach, Nora [1 ]
Domroese, Till [1 ]
Feist, Armin [1 ]
Rittmann, Thomas [1 ]
Strauch, Stefanie [1 ]
Ropers, Claus [1 ]
Schaefer, Sascha [1 ,2 ]
机构
[1] Univ Goettingen, Phys Inst Solids & Nanostruct 4, Gottingen, Germany
[2] Carl von Ossietzky Univ Oldenburg, Inst Phys, Oldenburg, Germany
来源
STRUCTURAL DYNAMICS-US | 2019年 / 6卷 / 01期
关键词
TRANSIENT STRUCTURES; CARRIER DYNAMICS; ATOMIC MOTIONS; DRIVEN; PROPAGATION; DIFFRACTION; MICROSCOPE; RESOLUTION; CRYSTALLOGRAPHY; ULTRABRIGHT;
D O I
10.1063/1.5066093
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Tip-based photoemission electron sources offer unique properties for ultrafast imaging, diffraction, and spectroscopy experiments with highly coherent few-electron pulses. Extending this approach to increased bunch-charges requires a comprehensive experimental study on Coulomb interactions in nanoscale electron pulses and their impact on beam quality. For a laser-driven Schottky field emitter, we assess the transverse and longitudinal electron pulse properties in an ultrafast transmission electron microscope at a high photoemission current density. A quantitative characterization of electron beam emittance, pulse duration, spectral bandwidth, and chirp is performed. Due to the cathode geometry, Coulomb interactions in the pulse predominantly occur in the direct vicinity to the tip apex, resulting in a well-defined pulse chirp and limited emittance growth. Strategies for optimizing electron source parameters are identified, enabling advanced ultrafast transmission electron microscopy approaches, such as phase-resolved imaging and holography. (C) 2019 Author(s).
引用
收藏
页数:8
相关论文
共 79 条
[1]   Coherent atomic motions in a nanostructure studied by femtosecond x-ray diffraction [J].
Bargheer, M ;
Zhavoronkov, N ;
Gritsai, Y ;
Woo, JC ;
Kim, DS ;
Woerner, M ;
Elsaesser, T .
SCIENCE, 2004, 306 (5702) :1771-1773
[2]   4D Imaging of Transient Structures and Morphologies in Ultrafast Electron Microscopy [J].
Barwick, Brett ;
Park, Hyun Soon ;
Kwon, Oh-Hoon ;
Baskin, J. Spencer ;
Zewail, Ahmed H. .
SCIENCE, 2008, 322 (5905) :1227-1231
[3]   Photon-induced near-field electron microscopy [J].
Barwick, Brett ;
Flannigan, David J. ;
Zewail, Ahmed H. .
NATURE, 2009, 462 (7275) :902-906
[4]  
Beaud P, 2014, NAT MATER, V13, P923, DOI [10.1038/nmat4046, 10.1038/NMAT4046]
[5]   COMPARISON OF TIPS THIN WIRES AND SHARP METAL EDGES AS EMITTERS FOR FIELD IONIZATION MASS SPTROMETRY [J].
BECKEY, HD ;
KRONE, H ;
ROELLGEN, FW .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (02) :118-&
[6]   Electron beam dynamics in an ultrafast transmission electron microscope with Wehnelt electrode [J].
Bikker, K. ;
Picher, M. ;
Cregut, O. ;
LaGrange, T. ;
Reed, B. W. ;
Park, S. T. ;
Masiel, D. J. ;
Banhart, F. .
ULTRAMICROSCOPY, 2016, 171 :8-18
[7]   EXPERIMENTELLE BESTIMMUNG DER ENERGIEVERTEILUNG IN THERMISCH AUSGELOSTEN ELEKTRONENSTRAHLEN [J].
BOERSCH, H .
ZEITSCHRIFT FUR PHYSIK, 1954, 139 (02) :115-146
[8]   Tip-Enhanced Strong-Field Photoemission [J].
Bormann, R. ;
Gulde, M. ;
Weismann, A. ;
Yalunin, S. V. ;
Ropers, C. .
PHYSICAL REVIEW LETTERS, 2010, 105 (14)
[9]   An ultrafast electron microscope gun driven by two-photon photoemission from a nanotip cathode [J].
Bormann, Reiner ;
Strauch, Stefanie ;
Schaefer, Sascha ;
Ropers, Claus .
JOURNAL OF APPLIED PHYSICS, 2015, 118 (17)
[10]   Extracting the Boersch effect contribution from experimental energy spread measurements for Schottky electron emitters [J].
Bronsgeest, M. S. ;
Barth, J. E. ;
Schwind, G. A. ;
Swanson, L. W. ;
Kruit, P. .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2007, 25 (06) :2049-2054