Optimization of decay kinetics of YAG:Ce single crystal scintillators for S(T)EM electron detectors

被引:13
作者
Schauer, Petr [1 ]
机构
[1] Acad Sci Czech Republ, Vvi, Inst Sci Instruments, Dept Elect Opt, CZ-61264 Brno, Czech Republic
关键词
Scintillation detector; Electron microscope; Cathodoluminescence; YAG:Ce single crystal scintillator; Decay time; Afterglow; Kinetic model; SEM; STEM; EFFICIENCY; CE; DEPENDENCE; PHOSPHORS;
D O I
10.1016/j.nimb.2011.07.013
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
To enhance the detective quantum efficiency (DQE) of scintillation electron detectors for scanning electron microscopes or scanning transmission electron microscopes (S(T)EM), the cathodoluminescence (CL) decay kinetics of YAG:Ce single crystal scintillators is studied in this paper. Some possibilities for reductions of decay time and afterglow of the mentioned scintillators are presented. The pulse mode utilizing a blanking system and 10 keV electrons for the excitation and a sampling oscilloscope for the CL detection were used for the measurement of decay characteristics. The CL decay characteristics of YAG:Ce single crystals of different Ce concentrations, pulled by the Czochralski method and cleaned and annealed under specific conditions, were measured in dependence on excitation pulse duration and on the specimen temperature. To interpret the presented results, a kinetic model of cathodoluminescence of the YAG:Ce single crystals was created. The effects of quenching impurities and of defect centers in YAG:Ce were specified. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:2572 / 2577
页数:6
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