Limit and Use of Near-Field Scan for Platform RFI Analysis

被引：4
作者：
Koo, Jayong [1 ]
Mix, Jason [1 ]
Slattery, Kevin [1 ]
机构：
[1] Intel Corp, Intel Labs, Hillsboro, OR 97220 USA
来源：
2010 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC 2010) | 2010年
关键词：
D O I：
10.1109/ISEMC.2010.5711277
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A near-field scan procedure for approximating the radio frequency (RF) current within an integrated circuit (IC) chip or printed circuit board (PCB) is suggested, and is examined for characterizing the radio frequency interference (RFI) of a mobile internet device research platform. The equivalent RF current obtained from the procedure serves as a model for the noise source and is used to estimate the near field distribution above a small micro processor. Comparison of the predicted near field distribution is made with measurements and the limitations of the approach is also discussed.
引用
收藏
页码：233 / 238
页数：6
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