Error-resistant single-qubit gates with trapped ions

被引：105

作者：

Timoney, N. ^{[1
]}

Elman, V. ^{[1
]}

Glaser, S. ^{[2
]}

Weiss, C. ^{[1
]}

Johanning, M. ^{[1
]}

Neuhauser, W. ^{[3
]}

Wunderlich, Chr. ^{[1
]}

机构：

[1] Univ Siegen, Fachbereich Phys, D-57068 Siegen, Germany

[2] Tech Univ Munich, Dept Chem, D-85747 Garching, Germany

[3] Univ Hamburg, Inst Laser Phys, D-22761 Hamburg, Germany

来源：

PHYSICAL REVIEW A | 2008年 / 77卷 / 05期

关键词：

D O I：

10.1103/PhysRevA.77.052334

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Coherent operations with individual trapped Yb+ ions are demonstrated that are robust against variations in experimental parameters and intrinsically indeterministic system parameters. In particular, pulses developed using optimal control theory are demonstrated with trapped ions. Their performance as a function of error parameters is systematically investigated and compared to composite pulses. Such pulses are basic building blocks for single and multiqubit quantum gates.

引用

页数：7

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