Determination of the attenuation of planar waveguides by means of detecting scattered light

被引:18
作者
Gut, K. [1 ]
Nowak, K. [1 ]
机构
[1] Silesian Tech Univ, Inst Phys, PL-44100 Gliwice, Poland
关键词
D O I
10.1140/epjst/e2008-00522-5
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Due to the variety of waveguides in planar structures, the measurements of attenuation are characterized by a considerable variety of applied methods, developed for given type of waveguides. The method of measuring scattered light is, therefore, of much importance in the case of waveguides with a rather high attenuation, because it is an exceptionally fast and simple method, which is doubtlessly the effect of the development of numerical detection systems. The paper presents the process of measurements basing on scattered light, combined with an analysis of its application, as well exemplary results concerning the planar structures of waveguides achieved by means of ion exchange on soda-lime glass.
引用
收藏
页码:89 / 92
页数:4
相关论文
共 12 条
[1]   New approach for loss measurements in optical planar waveguides [J].
Boudrioua, A ;
Loulergue, JC .
OPTICS COMMUNICATIONS, 1997, 137 (1-3) :37-40
[2]   HIGH-PRECISION PLANAR WAVE-GUIDE PROPAGATION LOSS MEASUREMENT TECHNIQUE USING A FABRY-PEROT CAVITY [J].
FEUCHTER, T ;
THRISTRUP, C .
IEEE PHOTONICS TECHNOLOGY LETTERS, 1994, 6 (10) :1244-1247
[3]   WAVE-GUIDE LOSS MEASUREMENT USING PHOTOTHERMAL DEFLECTION [J].
HICKERNELL, RK ;
LARSON, DR ;
PHELAN, RJ ;
LARSON, LE .
APPLIED OPTICS, 1988, 27 (13) :2636-2638
[4]  
Hunsperger R G., 1991, Integrated Optics: Theory and Technology, V3rd Edition
[5]   MEASURING MODE PROPAGATION LOSSES OF INTEGRATED OPTICAL-WAVEGUIDES - A SIMPLE METHOD [J].
OKAMURA, Y ;
YOSHINAKA, S ;
YAMAMOTO, S .
APPLIED OPTICS, 1983, 22 (23) :3892-3894
[6]   Low-frequency noises as a tool for UV detector characterisation [J].
Institute of Electronic Systems, Department of Electronics, Military University of Technology, 2 Kaliskiego Str, 00-908 Warsaw, Poland ;
不详 ;
不详 ;
ska Str, 01-919 Warsaw, Poland .
Opto-electron. Rev., 2006, 2 (155-160) :155-160
[7]  
Pustelny T, 2002, OPTO-ELECTRON REV, V10, P193
[8]   Technology and performances of silicon oxynitride waveguides for optomechanical sensors fabricated by plasma-enhanced chemical vapour deposition [J].
Sabac, A. ;
Gorecki, C. ;
Jozwik, M. ;
Nieradko, L. ;
Meunier, C. ;
Gut, K. .
JOURNAL OF THE EUROPEAN OPTICAL SOCIETY-RAPID PUBLICATIONS, 2007, 2
[9]   OPTICAL LOSS MEASUREMENT OF LOW-LOSS THIN-FILM WAVE-GUIDES BY PHOTOGRAPHIC ANALYSIS [J].
STRASSER, TA ;
GUPTA, MC .
APPLIED OPTICS, 1992, 31 (12) :2041-2046
[10]  
Tyszkiewcz C., 2005, MOL QUANT ACOUST, V26, P267