Lab on a tip: Applications of functional atomic force microscopy for the study of electrical properties in biology

被引:33
作者
Cheong, Ling-Zhi [1 ]
Zhao, Weidong [2 ,4 ]
Song, Shuang [3 ]
Shen, Cai [2 ]
机构
[1] Ningbo Univ, Coll Food & Pharmaceut Sci, Ningbo 315800, Zhejiang, Peoples R China
[2] Chinese Acad Sci, Ningbo Inst Mat Technol & Engn, 1219 West Zhongguan Rd, Ningbo 315201, Zhejiang, Peoples R China
[3] Chinese Ctr Dis Control & Prevent, Natl Inst Nutr & Hlth, Beijing 100050, Peoples R China
[4] Gannan Med Univ, Sch Informat Engn, Ganzhou 341000, Peoples R China
关键词
Atomic force microscopy; Electrical properties; Biology; SCANNING ELECTROCHEMICAL MICROSCOPY; SURFACE-POTENTIAL MEASUREMENTS; SINGLE DNA-MOLECULES; BACTERIAL NANOWIRES; CHARGE-TRANSPORT; NANOSCALE; PIEZORESPONSE; CONDUCTANCE; FIBRILS; LAYER;
D O I
10.1016/j.actbio.2019.08.023
中图分类号
R318 [生物医学工程];
学科分类号
0831 ;
摘要
Electrical properties, such as charge propagation, dielectrics, surface potentials, conductivity, and piezoelectricity, play crucial roles in biomolecules, biomembranes, cells, tissues, and other biological samples. However, characterizing these electrical properties in delicate biosamples is challenging. Atomic Force Microscopy (AFM), the so called "Lab on a Tip" is a powerful and multifunctional approach to quantitatively study the electrical properties of biological samples at the nanometer level. Herein, the principles, theories, and achievements of various modes of AFM in this area have been reviewed and summarized. Statement of Significance Electrical properties such as dielectric and piezoelectric forces, charge propagation behaviors play important structural and functional roles in biosystems from the single molecule level, to cells and tissues. Atomic force microscopy (AFM) has emerged as an ideal toolkit to study electrical property of biology. Herein, the basic principles of AFM are described. We then discuss the multiple modes of AFM to study the electrical properties of biological samples, including Electrostatic Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), Conductive Atomic Force Microscopy (CAFM), Piezoresponse Force Microscopy (PFM) and Scanning ElectroChemical Microscopy (SECM). Finally, the outlook, prospects, and challenges of the various AFM modes when studying the electrical behaviour of the samples are discussed. (C) 2019 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码:33 / 52
页数:20
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