X-ray nanospectroscopy for attogram-scale two-dimensional nanomaterials using photoelectron emission microscopy

被引：1

作者：

Kotani, Y. ^{[1
,5
]}

Taniuchi, T. ^{[2
]}

Osada, M. ^{[3
]}

Sasaki, T. ^{[3
]}

Kotsugi, M. ^{[4
]}

Ohkochi, T. ^{[4
]}

Watanabe, Y. ^{[4
]}

Ono, K. ^{[1
,5
]}

机构：

[1] High Energy Accelerator Res Org KEK, Photon Factory, Inst Mat Struct Sci, Tsukuba, Ibaraki 3050801, Japan

[2] Univ Tokyo, Inst Solid State Phys, Kashiwa, Chiba 2778581, Japan

[3] Natl Inst Mat Sci, Int Ctr Mat Nanoarchitech, Tsukuba, Ibaraki 3050044, Japan

[4] JASRI SPring 8, Hyogo 6795198, Japan

[5] Grad Univ Adv Studies, Tsukuba, Ibaraki 3050801, Japan

来源：

SRI 2009: THE 10TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION | 2010年 / 1234卷

关键词：

PEEM; x-ray absorption spectroscopy; two-dimensional nanomaterials; FILMS;

D O I：

10.1063/1.3463234

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have demonstrated x-ray nanospectroscopy for two-dimensional nanomaterials with attogram (=10(-18) gram) weight samples. The x-ray nanospectroscopic characterization of the nanomaterials was performed using SPELEEM (Spectroscopic Photoemission and Low Energy Electron Microscopy) at BL17SU of the SPring-8 in Japan. For quantitative x-ray absorption spectroscopy analysis with high spatial resolution and high stability during the photon energy scan, we have implemented a sample drift correction and a uniform lighting correction by image analysis. Using these corrections, the x-ray absorption spectra from 80 nm x 80 nm area are significantly improved and the layer-dependent electronic structure analysis is also demonstrated.

引用

页码：437 / +

页数：2

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