共 50 条
[42]
The Intermetallic Compound Formation for the Wire Bond Between an Al Pad and Ag-xPd Alloy Wire
[J].
Journal of Electronic Materials,
2016, 45
:6130-6136
[43]
Thermosonic wire bonding process simulation and bond pad over active stress analysis
[J].
IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING,
2008, 31 (01)
:61-71
[46]
Thermosonic wire bonding process simulation and bond pad over active stress analysis
[J].
54TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, VOLS 1 AND 2, PROCEEDINGS,
2004,
:383-391
[47]
Effect of Ag-11Au-4.5Pd Alloy Bonding Wire Properties and Structure on Bond Strengths and Reliability
[J].
2017 INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING (ICEP),
2017,
:223-228
[48]
A concept to relate wire bonding parameters to bondability and ball bond reliability
[J].
MICROELECTRONICS AND RELIABILITY,
1998, 38 (6-8)
:1287-1291
[49]
Wire bond reliability for power electronic modules - Effect of bonding temperature
[J].
EUROSIME 2007: THERMAL, MECHANICAL AND MULTI-PHYSICS SIMULATION AND EXPERIMENTS IN MICRO-ELECTRONICS AND MICRO-SYSTEMS, PROCEEDINGS,
2007,
:427-+
[50]
Concept to relate wire bonding parameters to bondability and ball bond reliability
[J].
Microelectronics Reliability,
1998, 38 (6-8)
:1287-1291