Free space material characterization of carbon nanotube thin films at sub-terahertz frequencies

被引：0

作者：

Puthukodan, Sujitha ^{[1
]}

Dadrasnia, Ehsan ^{[1
]}

Thalakkatukalathil, Vinod V. K. ^{[1
]}

Lamela Rivera, Horacio ^{[1
]}

Ducournau, Guillaume ^{[2
]}

Lampin, Jean-Francois ^{[2
]}

机构：

[1] Univ Carlos III Madrid, GOTL, Madrid, Spain

[2] Univ Lille, CNRS, Inst Elect Microelect & Nanotechnol, Villeneuve Dascq, France

来源：

JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS | 2016年 / 30卷 / 05期

关键词：

Continuous wave terahertz; vector network analyzer; carbon nanotubes; refractive index; absorption; conductivity; SINGLE; MICROWAVE; PERMEABILITY;

D O I：

10.1080/09205071.2016.1138898

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A free space, non-destructive, vectorial continuous wave terahertz analysis method is employed to study the material properties of single-walled and multi-walled carbon nanotube thin films deposited on substrates of fused quartz and silicon. The electrical and optical properties of the thin films have been investigated using a vector network analyzer, in the frequency range of 220-325 GHz (WR 3.4) and 325-500 GHz (WR 2.2). The Nicolson-Ross-Weir method is used to extract the material parameters. The refractive index, absorption coefficient, and the complex conductivity of the single-walled and multi-walled carbon nanotube thin films are extracted and studied.

引用

页码：589 / 598

页数：10

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