Bias voltage effect on the structure and property of chromium copper-diamond-like carbon multilayer films fabricated by cathodic arc plasma

被引:22
作者
Jao, Jui-Yun [1 ]
Han, Sheng [2 ]
Chang, Li-Shin [1 ]
Chang, Chi-Lung [3 ]
Liu, Yu-Ching [1 ]
Shih, Han C. [1 ,4 ]
机构
[1] Natl Chung Hsing Univ, Dept Mat Sci & Engn, Taichung 402, Taiwan
[2] Natl Taichung Inst Technol, Dept Leisure & Recreat Management, Taichung 404, Taiwan
[3] MingDao Univ, Dept Mat Sci & Engn, Changhua 523, Taiwan
[4] Chinese Culture Univ, Inst Mat Sci & Nanotechnol, Taipei 111, Taiwan
关键词
Diamond-like carbon; TEM; Cathodic arc evaporation; Multilayer; AMORPHOUS-CARBON; THIN-FILMS; COATINGS; EVAPORATION; DEPOSITION; GROWTH; HARD;
D O I
10.1016/j.apsusc.2010.05.095
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Chromium copper-diamond-like carbon (Cr:Cu)-DLC films were deposited onto silicon and by cathodic arc evaporation process using chromium (Cr) and copper (Cu) target arc sources to provide Cr and Cu in the Me-DLC. Acetylene reactive gases were the carbon source and activated at 180 degrees C at 13 mTorr, and a substrate bias voltage was varied from -50V to -200V to provide the (Cr:Cu)-DLC structure. The structure, interface, and chemical bonding state of the produced film were analyzed by transmission electron microscope (TEM), IR Fourier transform (FTIR) spectra, and X-ray photoelectron spectroscopy (XPS). The results showed that the Cr-containing a-C:H/Cu coatings exhibited an amorphous layer of DLC:Cr layer and a crystalline layer of Cu multilayer structure. The profiles of sp(3)/sp(2) (XPS) ratios corresponded to the change of microhardness profile by varying the pressure of the negative DC bias voltage. These (Cr:Cu)-DLC coatings are promising materials for soft substrate protective coatings. Crown Copyright (C) 2010 Published by Elsevier B.V. All rights reserved.
引用
收藏
页码:7490 / 7495
页数:6
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