Study of residual stress relaxation using X-ray diffraction

被引：8

作者：

Cheong, WCD ^{[1
]}

Zhuang, WZ

Zhang, LC

机构：

[1] Univ Sydney, Sch Aerosp Mech & Mechatron Engn, Sydney, NSW 2006, Australia

[2] Def Sci & Technol Org, Air Vehicles Div, Port Melbourne, Vic 3207, Australia

来源：

ADVANCES IN ENGINEERING PLASTICITY AND ITS APPLICATIONS, PTS 1 AND 2 | 2004年 / 274-276卷

关键词：

plasticity; residual stress; stress relaxation; fatigue test; x-ray diffraction;

D O I：

10.4028/www.scientific.net/KEM.274-276.871

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

An x-ray diffraction system was used to monitor and investigate the relaxation of residual stresses in Ti-6AI-4V material under low cycle fatigue (LCF) loading conditions. The surfaces of the specimens were treated by either shot peening or low-plasticity burnishing. After either surf ice treatment, the Ti-6AI-4V specimens were subjected to low cycle fatigue loading conditions. After varying LCF cycles, residual stresses at the surface of the specimens were measured using an x-ray diffraction system. The LCF tests were carried out in four-point bending at a cyclic frequency of 0.5 Hz. Residual stress relaxation is studied considering the LCF cycles and applied stress.

引用

页码：871 / 876

页数：6