Nondestructive inspection, testing and evaluation for Si-based, thin film and multi junction solar cells: An overview

被引:67
作者
Du, Bolun [1 ]
Yang, Ruizhen [2 ]
He, Yunze [1 ]
Wang, Feng [1 ]
Huang, Shoudao [1 ]
机构
[1] Hunan Univ, Coll Elect & Informat Engn, Changsha 410082, Hunan, Peoples R China
[2] Changsha Univ, Coll Civil Engn, Changsha 410022, Hunan, Peoples R China
基金
中国国家自然科学基金;
关键词
Solar cell; Thin film; Multi-junction; Nondestructive testing and evaluation; Reliability and availability; LOCK-IN THERMOGRAPHY; SPECKLE PATTERN INTERFEROMETRY; SCANNING-ELECTRON-MICROSCOPY; CRYSTALLINE SILICON-WAFERS; BEAM-INDUCED CURRENT; PHOTOVOLTAIC MODULES; CRACK DETECTION; ACOUSTIC MICROSCOPY; ELECTROLUMINESCENCE IMAGES; DYNAMIC RESISTANCE;
D O I
10.1016/j.rser.2017.05.017
中图分类号
X [环境科学、安全科学];
学科分类号
08 ; 0830 ;
摘要
Solar energy is one of the fastest growing renewable energy resources. It is extremely important to improve the reliability and availability of solar energy systems and to further reduce the operation and maintenance (O & M) cost. Solar cells and modules are considered as one of the most critical components in solar energy system because they convert solar energy into electricity. Flaws and damages are inevitable during either the fabrication or the service life of a solar cell or module. Thus, nondestructive inspection, testing and evaluation (NDI, NDT & NDE) for solar cells and modules are required in both manufacturing quality control and in-service inspection. In this work, a fully, in-depth and comprehensive review of NDT & E techniques for Si-based, thin film and multi-junction solar is reported based on an orderly and concise literature survey. Firstly, the developments and case comparison studies of electromagnetic, sonic and ultrasonic, optical, thermal, near-infrared, terahertz and mechanical test NDT & E for Si-based solar cells especially in the last three years are reviewed in detail. Next, the developments of NDT & E methods for film and multi-junction solar cells are also reviewed. After that, the strengths and limitations of these NDI and NDT techniques are concluded through comparison studies. Analytic hierarchy process (AHP) is used to compare 7 kinds of NDT methods which include photoluminescence (PL), electroluminescence (EL), illuminated lock-in thermography (ILIT), dark lock-in thermography (DLIT), resonance ultrasonic vibration (RUV), optical NDT and lamb wave air coupled ultrasonic testing (LAV-UT). In addition, the development tendencies for solar cell and related NDT & E are predicted. This work will serve as a guide for performance testing, failure analysis, quality control and health monitoring of Si-based cells, thin film and multi-junction solar cells and play an important role in solar energy safety control and cost saving.
引用
收藏
页码:1117 / 1151
页数:35
相关论文
共 174 条
[1]  
Abbott MD, 2006, WORL CON PHOTOVOLT E, P1211
[2]  
Abdelhamid M, 2014, COMPREHENSIVE ASSESS
[3]   Review of Microcrack Detection Techniques for Silicon Solar Cells [J].
Abdelhamid, Mahmoud ;
Singh, Rajendra ;
Omar, Mohammed .
IEEE JOURNAL OF PHOTOVOLTAICS, 2014, 4 (01) :514-524
[4]   Analysis of Cu(In,Ga)(S,Se)2 thin-film solar cells by means of electron microscopy [J].
Abou-Ras, D. ;
Dietrich, J. ;
Kavalakkatt, J. ;
Nichterwitz, M. ;
Schmidt, S. S. ;
Koch, C. T. ;
Caballero, R. ;
Klaer, J. ;
Rissom, T. .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2011, 95 (06) :1452-1462
[5]   The influence of defects on the cellular open circuit voltage in CuInGaSe2 thin film solar modules-An illuminated lock-in thermography study [J].
Adams, J. ;
Vetter, A. ;
Hoga, F. ;
Fecher, F. ;
Theisen, J. P. ;
Brabec, C. J. ;
Buerhop-Lutz, C. .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2014, 123 :159-165
[6]  
Algora C, 2016, CONCENTRATOR MULTIJU
[7]  
[Anonymous], 2014, P EWSHM 7 EUR WORKSH
[8]  
[Anonymous], SPIE OPTO
[9]   Structured wire: From single wire experiments to multi-crystalline silicon wafer mass production [J].
Anspach, Oliver ;
Hurka, Bjoern ;
Sunder, Kirsten .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2014, 131 :58-63
[10]  
Arens WE, 2015, J AIRCRAFT, V15, P21