Belok/XSA Diffraction Beamline for Studying Crystalline Samples at Kurchatov Synchrotron Radiation Source

被引：216

作者：

Svetogorov, Roman D. ^{[1
]}

Dorovatovskii, Pavel, V ^{[1
]}

Lazarenko, Vladimir A. ^{[1
]}

机构：

[1] Natl Res Ctr, Kurchatov Inst, 1 Akad Kurchatova Pl, Moscow 123182, Russia

来源：

CRYSTAL RESEARCH AND TECHNOLOGY | 2020年 / 55卷 / 05期

关键词：

crystal structures; diffraction beamline; Kurchatov synchrotron radiation source; powder diffraction; single-crystal diffraction; STATION;

D O I：

10.1002/crat.201900184

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

Introduction of "Belok/XSA" beamline-modernization is presented here with commissioning of a modern synchrotron beamline with unique capabilities for the structural analysis of single and polycrystalline samples. The beamline is designed to perform important tasks in modern crystallography, such as solving and refining the atomic structure using the single- and polycrystal method, studying the real (defective) structure, and analyzing the distribution of electron density in crystals, it is also possible to study rapidly occurring processes, for example, temperature phase transitions. Due to the speed of data accumulation and a registration over a large solid angle, the method allows to study large numbers of samples. This beamline has become extremely demanded in the chemical, biological, material science, and archaeological community in Russia.

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