Factors Limiting the Upper Frequency of mm-Wave Spherical Near-field Test Systems

被引:0
作者
van Rensburg, Daniel Janse [1 ]
机构
[1] Nearfield Syst Inc, 19730 Magellan Dr, Torrance, CA 90502 USA
来源
2015 9th European Conference on Antennas and Propagation (EuCAP) | 2015年
关键词
Spherical near-field; mm-wave; antenna measurement;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Antennas operating at mm-wave frequencies have led to the development of spherical near-field test systems that have to function at higher frequencies than before. This paper addresses some of the factors limiting the upper frequency bound of spherical near-field test systems in terms of what is practical with current technology. This includes mechanical positioning systems, RF sub-systems and the spherical near-field sampling requirements. Correction techniques that have been developed to enhance the performance of such measurement systems are also presented.
引用
收藏
页数:4
相关论文
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