DNN-Opt: An RL Inspired Optimization for Analog Circuit Sizing using Deep Neural Networks

被引:29
作者
Budak, Ahmet F. [1 ]
Bhansali, Prateek [2 ]
Liu, Bo [3 ]
Sun, Nan [1 ]
Pan, David Z. [1 ]
Kashyap, Chandramouli, V [2 ]
机构
[1] Univ Texas Austin, ECE Dept, Austin, TX 78712 USA
[2] Intel Corp, Santa Clara, CA 95051 USA
[3] Univ Glasgow, James Watt Sch Engn, Glasgow, Lanark, Scotland
来源
2021 58TH ACM/IEEE DESIGN AUTOMATION CONFERENCE (DAC) | 2021年
基金
美国国家科学基金会;
关键词
Analog Circuit Sizing Automation; Blackbox Optimization; Reinforcement Learning; Deep Neural Network;
D O I
10.1109/DAC18074.2021.9586139
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Analog circuit sizing takes a significant amount of manual effort in a typical design cycle. With rapidly developing technology and tight schedules, bringing automated solutions for sizing has attracted great attention. This paper presents DNN-Opt, a Reinforcement Learning (RL) inspired Deep Neural Network (DNN) based black-box optimization framework for analog circuit sizing. The key contributions of this paper are a novel sample-efficient two-stage deep learning optimization framework leveraging RL actor-critic algorithms, and a recipe to extend it on large industrial circuits using critical device identification. Our method shows 5-30x sample efficiency compared to other blackbox optimization methods both on small building blocks and on large industrial circuits with better performance metrics. To the best of our knowledge, this is the first application of DNN-based circuit sizing on industrial scale circuits.
引用
收藏
页码:1219 / 1224
页数:6
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