SiC detectors: A review on the use of silicon carbide as radiation detection material

被引:52
作者
Napoli, Marzio De [1 ]
机构
[1] Ist Nazl Fis Nucl INFN, Sez Catania, Catania, Italy
基金
欧盟地平线“2020”;
关键词
wide-bandgap semiconductors; silicon carbide (SiC); semiconductor radiation detectors; SiC detector fabrication; SiC detector characterization methods; defects in silicon carbide; radiation detection and measurement; radiation damage; 4H-SIC SCHOTTKY DIODES; LEVEL TRANSIENT SPECTROSCOPY; CHARGE COLLECTION EFFICIENCY; ELECTRON-IRRADIATED; 4H; FAST-NEUTRON DETECTION; GAMMA-IRRADIATION; DIAMOND DETECTORS; EPITAXIAL-GROWTH; STACKING-FAULTS; OHMIC CONTACTS;
D O I
10.3389/fphy.2022.898833
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Silicon Carbide (SiC) is a wide bandgap semiconductor with many excellent properties that make it one of the most promising and well-studied materials for radiation particle detection. This review provides an overview of the main advantages in the use of SiC detectors and the current state of research in this field. Key aspects related to material properties, growth techniques, doping, defects, electrical contacts, and characterization methods are summarized, with particular emphasis on how these can be related to detector performance. The most recent and significant experimental results on the use of SiC diodes for the detection of electrons, protons, alpha, ions, UV radiation, x/gamma-rays, and neutrons are discussed. The effects of high temperature operation and radiation damage on detector performance are outlined.
引用
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页数:28
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