Modelling of the influence of velocity overshoot on the cut-off frequency in Si and GaAs heterojunction bipolar transistors

被引:2
作者
Briggs, PJ
Walker, AB
Dunn, GM
Herbert, DC
机构
[1] UNIV SHEFFIELD,DEPT ELECT & ELECTR ENGN,SHEFFIELD S1 3JD,S YORKSHIRE,ENGLAND
[2] DEF RES AGCY,DIV ELECT,MALVERN WR14 3PS,WORCS,ENGLAND
关键词
D O I
10.1088/0268-1242/11/6/019
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present self-consistent Monte Carlo simulations of the collectors of Si and GaAs heterojunction bipolar transistors (HBTs) with wide (700 nm) collectors such as are used in power transistors. Recent experimental data on peak cut-off frequencies f(T) of 76 GHz for GaAs/AlGaAs HBTs have provided strong direct evidence for extended velocity overshoot in the collector under base push-out conditions and there are theoretical results using fast semi-analytic techniques confirming this explanation. Our aim is to investigate how these regions of extended velocity overshoot might form and how they would affect f(T) at high current densities in such structures. Differences in velocity-field characteristics and velocity overshoot between Si and GaAs collectors have large effects which are quantified by calculating f(T). Comparisons are also made with data from the semi-analytic results.
引用
收藏
页码:959 / 963
页数:5
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