Flicker Noise in N-type and P-type Silicon Nanowire Transistors

被引:0
|
作者
Yang, Seungwon [1 ]
Son, Younghwan [1 ]
Suk, Sung Dae [2 ]
Kim, Dong-Won [2 ]
Park, Donggun [2 ]
Oh, Kyungseok [2 ]
Shin, Hyungcheol [1 ]
机构
[1] Seoul Natl Univ, Dept EE, 059 San 56-1, Seoul 151742, South Korea
[2] Samsang Elect Co, Adv Technol, R&D Ctr, Dev Team, Nongseo Dong, South Korea
来源
2008 IEEE SILICON NANOELECTRONICS WORKSHOP | 2008年
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
For the first time, we have analyzed low frequency noise (1/f) of p-type silicon nanowire transistors (SNWT), and investigated its bias dependency. The results were compared with those in n-type silicon nanowire transistors as well as planar MOSFETs.
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页码:43 / +
页数:2
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